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Spectroscopic Ellipsometry
monograph
Author(s):
Hiroyuki Fujiwara
Publication date
(Print):
January 26 2007
Publisher:
John Wiley & Sons, Ltd
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Book
ISBN (Electronic):
9780470060193
ISBN (Print):
9780470016084
Publication date (Print):
January 26 2007
DOI:
10.1002/9780470060193
SO-VID:
3563fb53-29f7-4a8b-a78a-2fc108f96621
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Book chapters
pp. i
Front Matter
pp. 1
Introduction to Spectroscopic Ellipsometry
pp. 13
Principles of Optics
pp. 49
Polarization of Light
pp. 81
Principles of Spectroscopic Ellipsometry
pp. 147
Data Analysis
pp. 209
Ellipsometry of Anisotropic Materials
pp. 249
Data Analysis Examples
pp. 311
Real-Time Monitoring by Spectroscopic Ellipsometry
pp. 345
Appendix 1: Trigonometric Functions
pp. 347
Appendix 2: Definitions of Optical Constants
pp. 349
Appendix 3: Maxwell's Equations for Conductors
pp. 353
Appendix 4: Jones–Mueller Matrix Conversion
pp. 357
Appendix 5: Kramers–Kronig Relations
pp. 361
Index
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