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      Electromigration in ULSI interconnects

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      Materials Science and Engineering: R: Reports
      Elsevier BV

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          Electromigration in thin aluminum films on titanium nitride

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            Current-induced marker motion in gold wires

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              Electromigration—A brief survey and some recent results

              J.R. Black (1969)
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                Author and article information

                Journal
                Materials Science and Engineering: R: Reports
                Materials Science and Engineering: R: Reports
                Elsevier BV
                0927796X
                October 2007
                October 2007
                : 58
                : 1-2
                : 1-75
                Article
                10.1016/j.mser.2007.04.002
                1426fccb-86ca-4709-8059-fd86a81f6cc2
                © 2007

                http://www.elsevier.com/tdm/userlicense/1.0/

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