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      Young’s modulus measurements of thin films using micromechanics

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      Journal of Applied Physics
      AIP Publishing

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          The resonant gate transistor

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            Measurement of Strains at Si‐SiO2 Interface

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              Enhanced elastic modulus in composition‐modulated gold‐nickel and copper‐palladium foils

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                Author and article information

                Journal
                Journal of Applied Physics
                Journal of Applied Physics
                AIP Publishing
                0021-8979
                1089-7550
                November 1979
                November 1979
                : 50
                : 11
                : 6761-6766
                Article
                10.1063/1.325870
                16e4d5f4-fd77-4a88-8c0f-de09b7c04f8e
                © 1979
                History

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