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200 MeV silver ion irradiation induced structural modification in thin films at 89 K: An in situ x-ray diffraction study
Author(s):
R Biswal
,
J John
,
P. Mallick
,
B. C Dash
,
P. Kulriya
,
D. Avasthi
,
D Kanjilal
,
D Behera
,
T. Mohanty
,
P Raychaudhuri
,
N. Mishra
,
Narayan Mishra
Publication date:
2009
Journal:
J. Appl. Phys.
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TKD - Transmission Kikuchi Diffraction
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Journal
DOI::
10.1063/1.3212537
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Uncategorized
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