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867
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Deep defect levels in standard and oxygen enriched silicon detectors before and after 60Co-γ-irradiation
Author(s):
J. STAHL
,
E. Fretwurst
,
G Lindström
,
I. Pintilie
Publication date:
2003
Journal:
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
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Computer Vision, Deep Learning, Deep Reinforcement Learning, IoT
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DOI::
10.1016/S0168-9002(03)01884-9
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