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      Orientation mapping of nanostructured materials using transmission Kikuchi diffraction in the scanning electron microscope.

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      Ultramicroscopy
      Elsevier BV

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          Abstract

          In this study, the new technique of transmission Kikuchi diffraction (TKD) in the scanning electron microscope (SEM) has been applied for the first time to enable orientation mapping of bulk, nanostructured metals. The results show how the improved spatial resolution of SEM-TKD, compared to conventional EBSD, enables reliable mapping of truly nanostructured metals and alloys, with mean grain sizes in the 40-200 nm range. The spatial resolution of the technique is significantly below 10nm, and contrasting examples are shown from both dense (Ni) and lighter (Al-alloy) materials. Despite the burden of preparing thin, electron-transparent samples, orientation mapping using SEM-TKD is likely to become invaluable for routine characterisation of nanocrystalline and, potentially, highly deformed microstructures.

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          Author and article information

          Journal
          Ultramicroscopy
          Ultramicroscopy
          Elsevier BV
          1879-2723
          0304-3991
          Sep 2012
          : 120
          Affiliations
          [1 ] Australian Centre for Microscopy & Microanalysis, The University of Sydney, Madsen Building F09 Sydney, NSW 2006, Australia. patrick.trimby@sydney.edu.au
          Article
          S0304-3991(12)00125-8
          10.1016/j.ultramic.2012.06.004
          22796555
          b852ff02-6333-41ba-974e-40465c9a35ac
          History

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