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      WSXM: a software for scanning probe microscopy and a tool for nanotechnology.

      The Review of scientific instruments
      Image Enhancement, Microscopy, Atomic Force, methods, Nanotechnology, Software

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          Abstract

          In this work we briefly describe the most relevant features of WSXM, a freeware scanning probe microscopy software based on MS-Windows. The article is structured in three different sections: The introduction is a perspective on the importance of software on scanning probe microscopy. The second section is devoted to describe the general structure of the application; in this section the capabilities of WSXM to read third party files are stressed. Finally, a detailed discussion of some relevant procedures of the software is carried out.

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          Author and article information

          Journal
          17503926
          10.1063/1.2432410

          Chemistry
          Image Enhancement,Microscopy, Atomic Force,methods,Nanotechnology,Software
          Chemistry
          Image Enhancement, Microscopy, Atomic Force, methods, Nanotechnology, Software

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