Nanostructure Analysis of Complex Materials using Two-Dimensional Small Angle X-Ray Scattering

Jakob, Hannes F.; Erlacher, Kurt; Fratzl, Peter

doi:10.4028/www.scientific.net/MSF.414-415.411

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Nanostructure Analysis of Complex Materials using Two-Dimensional Small Angle X-Ray Scattering

Author(s): Hannes F. Jakob , Kurt Erlacher , Peter Fratzl

Publication date Created: 2003

Publication date (Print): 2003

Journal: Materials Science Forum

Publisher: Trans Tech Publications

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Journal ID (publisher-id): MSF

Title: Materials Science Forum

Abbreviated Title: MSF

Publisher: Trans Tech Publications

ISSN (Electronic): 1662-9752

Publication date Created: 2003

Publication date (Print): 2003

Volume: 414-415

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Pages: 411-418

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DOI: 10.4028/www.scientific.net/MSF.414-415.411

SO-VID: 03b0b7f3-1944-4f17-8660-5f53d2a3a88d

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Nanostructure Analysis of Complex Materials using Two-Dimensional Small Angle X-Ray Scattering

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