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      Stochastic Degradation Models With Several Accelerating Variables

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      IEEE Transactions on Reliability
      Institute of Electrical and Electronics Engineers (IEEE)

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          Most cited references21

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          A New Family of Life Distributions

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            Using Degradation Measures to Estimate a Time-to-Failure Distribution

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              32—X.—Tensile Tests for Cotton Yarns v.—“The Weakest Link” Theorems on the Strength of Long and of Composite Specimens

              (1926)
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                Author and article information

                Journal
                IEEE Transactions on Reliability
                IEEE Trans. Rel.
                Institute of Electrical and Electronics Engineers (IEEE)
                0018-9529
                June 2006
                June 2006
                : 55
                : 2
                : 379-390
                Article
                10.1109/TR.2006.874937
                0456e484-ee2f-4088-976d-cfa54f2d2868
                © 2006
                Product
                Self URI (article page): http://ieeexplore.ieee.org/document/1638421/

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