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      Stochastic Degradation Models With Several Accelerating Variables

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      Journal: IEEE Transactions on Reliability
      Publisher: Institute of Electrical and Electronics Engineers (IEEE)

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          A New Family of Life Distributions

          S. Saunders, Z. W. Birnbaum (1969)
          Article 0 comments Cited 71 times – based on 0 reviews     Review now
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            32—X.—Tensile Tests for Cotton Yarns v.—“The Weakest Link” Theorems on the Strength of Long and of Composite Specimens

            (1926)
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              Using Degradation Measures to Estimate a Time-to-Failure Distribution

              William Q. Meeker, C. Lu (1993)
              Article 0 comments Cited 58 times – based on 0 reviews     Review now
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                Author and article information

                Journal
                Title: IEEE Transactions on Reliability
                Abbreviated Title: IEEE Trans. Rel.
                Publisher: Institute of Electrical and Electronics Engineers (IEEE)
                ISSN (Print): 0018-9529
                Publication date Created: June 2006
                Publication date (Print): June 2006
                Volume: 55
                Issue: 2
                Pages: 379-390
                Article
                DOI: 10.1109/TR.2006.874937
                SO-VID: 0456e484-ee2f-4088-976d-cfa54f2d2868
                Copyright © © 2006
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