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      Framework and development of fault detection classification using IoT device and cloud environment

      Journal of Manufacturing Systems
      Elsevier BV

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          Journal
          Journal of Manufacturing Systems
          Journal of Manufacturing Systems
          Elsevier BV
          02786125
          April 2017
          April 2017
          : 43
          : 257-270
          Article
          10.1016/j.jmsy.2017.02.007
          05b00948-488f-461b-bdda-70b30a1c8915
          © 2017

          https://www.elsevier.com/tdm/userlicense/1.0/

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