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      A unified model of carrier diffusion and sampling aperture effects on MTF in solid-state image sensors

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          Most cited references10

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          Carrier diffusion degradation of modulation transfer function in charge coupled imagers

          D.H. Seib (1974)
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            • Abstract: not found
            • Article: not found

            Steady-state photocarrier collection in silicon imaging devices

              • Record: found
              • Abstract: not found
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              Smear reduction in the interline CCD image sensor

                Author and article information

                Journal
                IEEE Transactions on Electron Devices
                IEEE Trans. Electron Devices
                Institute of Electrical and Electronics Engineers (IEEE)
                00189383
                Nov. 1992
                : 39
                : 11
                : 2621-2623
                Article
                10.1109/16.163473
                0703cf26-43ec-4f0e-9dd8-ba895c5dc273
                © 1992
                History

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