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      Critical layer thicknesses for inclined dislocation stability in multilayer structures

      Author(s): ,
      Publication date Created:
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      Journal: Journal of Applied Physics
      Publisher: AIP Publishing

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          Relaxation of strained‐layer semiconductor structures via plastic flow

          Brian Dodson, Jeffrey Y. Tsao (1987)
          Article 0 comments Cited 161 times – based on 0 reviews     Review now
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            Defects in epitaxial multilayers

            A.E. Blakeslee, J.W. Matthews (1975)
            Article 0 comments Cited 132 times – based on 0 reviews     Review now
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              A new type of source generating misfit dislocations

              W. Hagen, H Strunk (1978)
              Article 0 comments Cited 70 times – based on 0 reviews     Review now
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                Author and article information

                Journal
                Title: Journal of Applied Physics
                Abbreviated Title: Journal of Applied Physics
                Publisher: AIP Publishing
                ISSN (Print): 0021-8979
                ISSN (Electronic): 1089-7550
                Publication date Created: August 15 1992
                Publication date (Print): August 15 1992
                Volume: 72
                Issue: 4
                Pages: 1386-1394
                Article
                DOI: 10.1063/1.351750
                SO-VID: 07da2fca-0d6e-4355-a513-aee1d64a5ff6
                Copyright © © 1992
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