Sensitive measurement of optical nonlinearities using a single beam

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Journal

Title: IEEE Journal of Quantum Electronics

Abbreviated Title: IEEE J. Quantum Electron.

Publisher: Institute of Electrical and Electronics Engineers (IEEE)

ISSN (Print): 00189197

Publication date (Print): April 1990

Volume: 26

Issue: 4

Pages: 760-769

Article

DOI: 10.1109/3.53394

SO-VID: 07df6e9b-4fc8-4d90-9dca-7ab53e690edc

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