Rapid characterization of extended defects in III&amp;#x2013;V/Si by electron channeling contrast imaging

Carnevale, Santino D; Deitz, Julia I; Carlin, John A.; Picard, Yoosuf N.; De Graef, Marc; Ringel, Steven A.; Grassman, Tyler J

doi:10.1109/PVSC.2014.6925512

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Rapid characterization of extended defects in III–V/Si by electron channeling contrast imaging

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Author(s): Santino D. Carnevale , Julia I. Deitz , John A. Carlin , Yoosuf N. Picard , Marc De Graef , Steven A. Ringel , Tyler J. Grassman

Publication date (Print): June 2014

Conference name: 2014 IEEE 40th Photovoltaic Specialists Conference (PVSC)

Conference date: July 8, 2014 - July 13, 2014

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Publication date: June 2014

Publication date (Print): June 2014

Pages: 2800-2803

Article

DOI: 10.1109/PVSC.2014.6925512

SO-VID: 09d4052f-b0f8-450c-8af7-a57677114122

Conference name: 2014 IEEE 40th Photovoltaic Specialists Conference (PVSC)

Conference location: Denver, CO, USA

Conference date: July 8, 2014 - July 13, 2014

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Cited by 1

Applications of Electron Channeling Contrast Imaging for the Rapid Characterization of Extended Defects in III–V/Si Heterostructures
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