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      Raman characterization of strain and composition in small-sized self-assembled Si/Ge dots

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      Physical Review B

      American Physical Society (APS)

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          Most cited references 24

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          Stress-Induced Shifts of First-Order Raman Frequencies of Diamond- and Zinc-Blende-Type Semiconductors

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            Multiphonon Raman Spectrum of Silicon

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              Raman spectra ofc-Si1−xGexalloys

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                Author and article information

                Journal
                PRBMDO
                Physical Review B
                Phys. Rev. B
                American Physical Society (APS)
                0163-1829
                1095-3795
                September 2003
                September 4 2003
                : 68
                : 12
                Article
                10.1103/PhysRevB.68.125302
                © 2003

                http://link.aps.org/licenses/aps-default-license

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