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      Raman characterization of strain and composition in small-sized self-assembled Si/Ge dots

      Author(s): , , ,
      Publication date (Print):
      Journal: Physical Review B
      Publisher: American Physical Society (APS)

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          Stress-Induced Shifts of First-Order Raman Frequencies of Diamond- and Zinc-Blende-Type Semiconductors

          C. J. Buchenauer, F. Cerdeira, Manuel Cardona … (1972)
          Article 0 comments Cited 233 times – based on 0 reviews     Review now
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            Multiphonon Raman Spectrum of Silicon

            Paul A. Temple, C. Hathaway (1973)
            Article 0 comments Cited 167 times – based on 0 reviews     Review now
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              Raman spectra ofc-Si1−xGexalloys

              M. Alonso-Vale, Karen Winer (1989)
              Article 0 comments Cited 109 times – based on 0 reviews     Review now
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                Author and article information

                Journal
                Journal ID (publisher-id): PRBMDO
                Title: Physical Review B
                Abbreviated Title: Phys. Rev. B
                Publisher: American Physical Society (APS)
                ISSN (Print): 0163-1829
                ISSN (Electronic): 1095-3795
                Publication date Created: September 2003
                Publication date (Print): September 4 2003
                Volume: 68
                Issue: 12
                Article
                DOI: 10.1103/PhysRevB.68.125302
                SO-VID: 0cf34c78-c89f-4443-beaa-67bd0c6675d7
                Copyright © © 2003
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                http://link.aps.org/licenses/aps-default-license

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