A Comparison of Distributed Test Generation Techniques

Testing is an important step of the development of complex systems. It requires a lot of resources of memory and time. In addition, the complexity of such a step increases if the systems handle time constraints. In this paper, we present several solutions to generate test sequences in a distributed manner. Our methods are first explained and then compared from a theoretical point of view. Our solution leveraging DHT networks seems to be the most efficient to tackle test generation on very large-scale networks.

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Publication date: July 2008

Publication date (Print): July 2008

Pages: 1-12

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DOI: 10.14236/ewic/VECOS2008.4

SO-VID: 0e03f2f4-0837-4d6a-9195-55ad97ccd8b8

Copyright © © Harry Gros-Desormeaux et al. Published by BCS Learning and Development Ltd. Second International Workshop on Verification and Evaluation of Computer and Communication Systems (VECoS 2008)

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This work is licensed under a Creative Commons Attribution 4.0 Unported License. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/

Conference name: Second International Workshop on Verification and Evaluation of Computer and Communication Systems (VECoS 2008)

Conference acronym: VECoS

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Conference location: Leeds, UK

Conference date: 2 - 3 July 2008

Conference sponsor: Electronic Workshops in Computing (eWiC)

Conference theme: Verification and Evaluation of Computer and Communication Systems

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1477-9358 BCS Learning & Development

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A Comparison of Distributed Test Generation Techniques

Abstract