A Guided Tour of Selected Image Processing and Analysis Methods for Fluorescence and Electron Microscopy

Kervrann, Charles; Sanchez Sorzano, Carlos Oscar; Acton, Scott T.; Olivo-Marin, Jean-Christophe; Unser, Michael

doi:10.1109/JSTSP.2015.2505402

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A Guided Tour of Selected Image Processing and Analysis Methods for Fluorescence and Electron Microscopy

Author(s): Charles Kervrann , Carlos Oscar Sanchez Sorzano , Scott T. Acton , Jean-Christophe Olivo-Marin , Michael Unser

Publication date (Print): February 2016

Journal: IEEE Journal of Selected Topics in Signal Processing

Publisher: Institute of Electrical and Electronics Engineers (IEEE)

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Most cited references 249

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De-noising by soft-thresholding

D.L. Donoho (1995)

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A Review of Image Denoising Algorithms, with a New One

A. Buades, B Coll, J. M. Morel (2005)

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A new method for gray-level picture thresholding using the entropy of the histogram

J.N. Kapur, P.K. Sahoo, A.K.C. Wong (1985)

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Journal

Title: IEEE Journal of Selected Topics in Signal Processing

Abbreviated Title: IEEE J. Sel. Top. Signal Process.

Publisher: Institute of Electrical and Electronics Engineers (IEEE)

ISSN (Print): 1932-4553

ISSN (Electronic): 1941-0484

Publication date Created: February 2016

Publication date (Print): February 2016

Volume: 10

Issue: 1

Pages: 6-30

Article

DOI: 10.1109/JSTSP.2015.2505402

SO-VID: 0eba1f98-f276-451c-8654-6f467fb601f5

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A Guided Tour of Selected Image Processing and Analysis Methods for Fluorescence and Electron Microscopy

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Atomic Force Microscopy

Most cited references 249

De-noising by soft-thresholding

A Review of Image Denoising Algorithms, with a New One

A new method for gray-level picture thresholding using the entropy of the histogram

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