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      A statistical iteration approach with energy minimization to sinogram noise reduction for low-dose X-ray CT

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      Optik
      Elsevier BV

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          Journal
          Optik
          Optik
          Elsevier BV
          00304026
          December 2012
          December 2012
          : 123
          : 23
          : 2174-2178
          Article
          10.1016/j.ijleo.2011.10.014
          0edecec2-68a2-41d3-bb11-3e281d197d4a
          © 2012

          https://www.elsevier.com/tdm/userlicense/1.0/

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