Four-Dimensional Scanning Transmission Electron Microscopy (4D-STEM): From Scanning Nanodiffraction to Ptychography and Beyond

There is no author summary for this article yet. Authors can add summaries to their articles on ScienceOpen to make them more accessible to a non-specialist audience.

Abstract

Scanning transmission electron microscopy (STEM) is widely used for imaging, diffraction, and spectroscopy of materials down to atomic resolution. Recent advances in detector technology and computational methods have enabled many experiments that record a full image of the STEM probe for many probe positions, either in diffraction space or real space. In this paper, we review the use of these four-dimensional STEM experiments for virtual diffraction imaging, phase, orientation and strain mapping, measurements of medium-range order, thickness and tilt of samples, and phase contrast imaging methods, including differential phase contrast, ptychography, and others.

Related collections

Most cited references 212

Record: found
Abstract: not found
Article: not found

Topology of covalent non-crystalline solids I: Short-range order in chalcogenide alloys

J.C. Phillips (1979)

0 comments Cited 313 times – based on 0 reviews      Review now

Bookmark

Record: found
Abstract: found
Article: not found

An improved ptychographical phase retrieval algorithm for diffractive imaging.

Andrew M. Maiden, John M. Rodenburg (2009)

The ptychographical iterative engine (or PIE) is a recently developed phase retrieval algorithm that employs a series of diffraction patterns recorded as a known illumination function is translated to a set of overlapping positions relative to a target sample. The technique has been demonstrated successfully at optical and X-ray wavelengths and has been shown to be robust to detector noise and to converge considerably faster than support-based phase retrieval methods. In this paper, the PIE is extended so that the requirement for an accurate model of the illumination function is removed.