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      Resolving the geometrically necessary dislocation content by conventional electron backscattering diffraction

      Scripta Materialia
      Elsevier BV

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          Some geometrical relations in dislocated crystals

          J.F Nye (1953)
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            High-resolution elastic strain measurement from electron backscatter diffraction patterns: new levels of sensitivity.

            In this paper, we demonstrate that the shift between similar features in two electron backscatter diffraction (EBSD) patterns can be measured using cross-correlation based methods to +/- 0.05 pixels. For a scintillator screen positioned to capture the usual large solid angle employed in EBSD orientation mapping this shift corresponds to only approximately 8.5 x 10(-5)rad at the pattern centre. For wide-angled EBSD patterns, the variation in the entire strain and rotation tensor can be determined from single patterns. Repeated measurements of small rotations applied to a single-crystal sample, determined using the shifts at four widely separated parts of the EBSD patterns, showed a standard deviation of 1.3 x 10(-4) averaged over components of the displacement gradient tensor. Variations in strains and rotations were measured across the interface in a cross-sectioned Si1-x Gex epilayer on a Si substrate. Expansion of the epilayer close to the section surface is accommodated by tensile strains and lattice curvature that extend a considerable distance into the substrate. Smaller and more localised shear strains are observed close to the substrate-layer interface. EBSD provides an impressive and unique combination of high strain sensitivity, high spatial resolution and ease of use.
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              Observations of lattice curvature near the interface of a deformed aluminium bicrystal

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                Author and article information

                Journal
                Scripta Materialia
                Scripta Materialia
                Elsevier BV
                13596462
                June 2008
                June 2008
                : 58
                : 11
                : 994-997
                Article
                10.1016/j.scriptamat.2008.01.050
                12b46bf5-debf-4971-b071-e8e510e19b9e
                © 2008

                http://www.elsevier.com/tdm/userlicense/1.0/

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