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      Electromigration in ULSI interconnects

      Author(s): ,
      Publication date Created:
      Publication date (Print):
      Journal: Materials Science and Engineering: R: Reports
      Publisher: Elsevier BV

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          Electromigration in thin aluminum films on titanium nitride

          I. A. Blech (1976)
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            Electromigration—A brief survey and some recent results

            J.R. Black (1969)
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              Current-induced marker motion in gold wires

              A.R. Grone, H.B. Huntington (1961)
              Article 0 comments Cited 142 times – based on 0 reviews     Review now
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                Author and article information

                Journal
                Title: Materials Science and Engineering: R: Reports
                Abbreviated Title: Materials Science and Engineering: R: Reports
                Publisher: Elsevier BV
                ISSN (Print): 0927796X
                Publication date Created: October 2007
                Publication date (Print): October 2007
                Volume: 58
                Issue: 1-2
                Pages: 1-75
                Article
                DOI: 10.1016/j.mser.2007.04.002
                SO-VID: 1426fccb-86ca-4709-8059-fd86a81f6cc2
                Copyright © © 2007
                License:

                http://www.elsevier.com/tdm/userlicense/1.0/

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