11
views
0
recommends
+1 Recommend
0 collections
    0
    shares
      • Record: found
      • Abstract: not found
      • Article: not found

      On the Factors Affecting the Reflection Intensities by the Several Methods of X-Ray Analysis of Crystal Structures

      Reviews of Modern Physics
      American Physical Society (APS)

      Read this article at

      ScienceOpenPublisher
      Bookmark
          There is no author summary for this article yet. Authors can add summaries to their articles on ScienceOpen to make them more accessible to a non-specialist audience.

          Related collections

          Most cited references75

          • Record: found
          • Abstract: not found
          • Article: not found

          The calculation of atomic fields

          L H Thomas (1927)
            Bookmark
            • Record: found
            • Abstract: not found
            • Article: not found

            Eine statistische Methode zur Bestimmung einiger Eigenschaften des Atoms und ihre Anwendung auf die Theorie des periodischen Systems der Elemente

            E Fermi (1928)
              Bookmark
              • Record: found
              • Abstract: not found
              • Article: not found

              Diffusion de la lumière et des rayons X par un corps transparent homogène

                Bookmark

                Author and article information

                Journal
                RMPHAT
                Reviews of Modern Physics
                Rev. Mod. Phys.
                American Physical Society (APS)
                0034-6861
                July 1933
                July 1 1933
                : 5
                : 3
                : 169-202
                Article
                10.1103/RevModPhys.5.169
                14cb8f0e-324c-46a6-8829-6785c5033c6b
                © 1933

                http://link.aps.org/licenses/aps-default-license

                History

                Comments

                Comment on this article