Generating feature sets for fault diagnosis using denoising stacked auto-encoder

Thirukovalluru, Raghuveer; Dixit, Sonal; Sevakula, Rahul K.; Verma, Nishchal K.; Salour, Al

doi:10.1109/ICPHM.2016.7542865

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Generating feature sets for fault diagnosis using denoising stacked auto-encoder

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Author(s): Raghuveer Thirukovalluru , Sonal Dixit , Rahul K. Sevakula , Nishchal K. Verma , Al Salour

Publication date (Print): June 2016

Publisher: IEEE

Conference name: 2016 IEEE International Conference on Prognostics and Health Management (ICPHM)

Conference date: July 20, 2016 - July 22, 2016

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Publisher: IEEE

Publication date: June 2016

Publication date (Print): June 2016

Pages: 1-7

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DOI: 10.1109/ICPHM.2016.7542865

SO-VID: 1517aba5-4816-4820-a537-9ec2a9e93325

Conference name: 2016 IEEE International Conference on Prognostics and Health Management (ICPHM)

Conference location: Ottawa, ON, Canada

Conference date: July 20, 2016 - July 22, 2016

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ScienceOpen disciplines: Evolutionary Biology, Medicine

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Generating feature sets for fault diagnosis using denoising stacked auto-encoder

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