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6,151
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Young’s modulus measurements of thin films using micromechanics
Author(s):
Kurt E. Petersen
,
C. R. Guarnieri
Publication date
Created:
November 1979
Publication date
(Print):
November 1979
Journal:
Journal of Applied Physics
Publisher:
AIP Publishing
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The resonant gate transistor
H.C. Nathanson
,
W.E. Newell
,
R.A. Wickstrom
…
(1967)
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Measurement of Strains at Si‐SiO2 Interface
W. A. Schlegel
,
R. Jaccodine
(1966)
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Enhanced elastic modulus in composition‐modulated gold‐nickel and copper‐palladium foils
T. Tsakalakos
,
W. Yang
,
J. E. Hilliard
(1977)
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Author and article information
Journal
Title:
Journal of Applied Physics
Abbreviated Title:
Journal of Applied Physics
Publisher:
AIP Publishing
ISSN (Print):
0021-8979
ISSN (Electronic):
1089-7550
Publication date Created:
November 1979
Publication date (Print):
November 1979
Volume
: 50
Issue
: 11
Pages
: 6761-6766
Article
DOI:
10.1063/1.325870
SO-VID:
16e4d5f4-fd77-4a88-8c0f-de09b7c04f8e
Copyright ©
© 1979
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