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      Misfit dislocations in lattice-mismatched epitaxial films

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      Critical Reviews in Solid State and Materials Sciences
      Informa UK Limited

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          Dislocation-free Stranski-Krastanow growth of Ge on Si(100).

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            Calculation of critical layer thickness versus lattice mismatch for GexSi1−x/Si strained‐layer heterostructures

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              GexSi1−x/Si strained‐layer superlattice grown by molecular beam epitaxy

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                Author and article information

                Journal
                Critical Reviews in Solid State and Materials Sciences
                Critical Reviews in Solid State and Materials Sciences
                Informa UK Limited
                1040-8436
                1547-6561
                January 1992
                January 1992
                : 17
                : 6
                : 507-546
                Article
                10.1080/10408439208244585
                1745e5a5-d2a8-42db-bce2-f87ce756607a
                © 1992
                History

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