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The mechanism of self-healing electrical breakdown in MOS structures
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Most cited references12
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Investigation of thermally oxidised silicon surfaces using metal-oxide-semiconductor structures
E.H. Snow, B.E. Deal, A.S. Grove … (1965)
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Analysis of Electrode Phenomena in the High‐Current Arc
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Electron and hole mobilities in inversion layers on thermally oxidized silicon surfaces
O. Leistiko, A.S. Grove, C.T. Sah (1965)