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      Random error effects in matched MOS capacitors and current sources

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      IEEE Journal of Solid-State Circuits
      Institute of Electrical and Electronics Engineers (IEEE)

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          All-MOS charge redistribution analog-to-digital conversion techniques. I

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            MOS operational amplifier design-a tutorial overview

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              • Record: found
              • Abstract: not found
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              Matching properties, and voltage and temperature dependence of MOS capacitors

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                Author and article information

                Journal
                IEEE Journal of Solid-State Circuits
                IEEE J. Solid-State Circuits
                Institute of Electrical and Electronics Engineers (IEEE)
                0018-9200
                December 1984
                December 1984
                : 19
                : 6
                : 948-956
                Article
                10.1109/JSSC.1984.1052250
                18db01f0-85c3-472e-9579-eb153ebb89ee
                © 1984
                History

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