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      A precision method for laser focusing on laser beam induced current experiments

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      Review of Scientific Instruments
      AIP Publishing

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          The electrical properties of dislocations in silicon—I

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            Mapping of defects and their recombination strenght by a light-beam-induced current in silicon wafers

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              Advances in silicon surface characterisation using light beam injection techniques

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                Author and article information

                Journal
                Review of Scientific Instruments
                Review of Scientific Instruments
                AIP Publishing
                0034-6748
                1089-7623
                November 2002
                November 2002
                : 73
                : 11
                : 3895-3900
                Article
                10.1063/1.1511794
                191f293f-5325-4baf-9476-e826f147bb27
                © 2002
                History

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