For Publishers
DiscoveryMetadataPeer reviewHostingPublishing
For Researchers
JoinPublishReviewCollect
Register
Blog
About
Search
Advanced search
My ScienceOpen
Search
For Publishers
For Researchers
Blog
About
4
views
33
references
 Top references
cited by
18
    
0 reviews
 Review
0
comments
 Comment
0
recommends
+1 Recommend
0 collections
    0
    shares
      878
      similar
       All similar
      • Record: found
      • Abstract: not found
      • Article: not found

      An empirical investigation of the key factors for success in software process improvement

      Read this article at

      ScienceOpenPublisher
      Bookmark
          There is no author summary for this article yet. Authors can add summaries to their articles on ScienceOpen to make them more accessible to a non-specialist audience.

          Related collections

          Most cited references33

          • Record: found
          • Abstract: found
          • Article: not found

          Coefficient alpha and the internal structure of tests

          Lee Cronbach (1951)
          Psychometrika, 16(3), 297-334
          Article 0 comments Cited 6118 times – based on 0 reviews     Review now
            Bookmark
            • Record: found
            • Abstract: not found
            • Article: not found

            A second generation little jiffy

            Henry F. Kaiser (1970)
            Article 0 comments Cited 647 times – based on 0 reviews     Review now
              Bookmark
              • Record: found
              • Abstract: not found
              • Article: not found

              Validating Instruments in MIS Research

              Detmar Straub (1989)
              Article 0 comments Cited 286 times – based on 0 reviews     Review now
                Bookmark
                All references

                Author and article information

                Journal
                Title: IEEE Transactions on Software Engineering
                Abbreviated Title: IIEEE Trans. Software Eng.
                Publisher: Institute of Electrical and Electronics Engineers (IEEE)
                ISSN (Print): 0098-5589
                Publication date Created: May 2005
                Publication date (Print): May 2005
                Volume: 31
                Issue: 5
                Pages: 410-424
                Article
                DOI: 10.1109/TSE.2005.53
                SO-VID: 1b2b3355-ab22-4a54-8ad3-bbcbe3b38c89
                Copyright © © 2005
                History

                Data availability:

                Comments

                Comment on this article

                scite_

                Similar content878

                See all similar

                Cited by16

                See all cited by

                Most referenced authors339

                See all reference authors