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      Advances in atomic force microscopy

      Reviews of Modern Physics
      American Physical Society (APS)

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          Most cited references142

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          Atomic Force Microscope

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            Computer simulation of local order in condensed phases of silicon

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              Surface Studies by Scanning Tunneling Microscopy

                Author and article information

                Journal
                RMPHAT
                Reviews of Modern Physics
                Rev. Mod. Phys.
                American Physical Society (APS)
                0034-6861
                1539-0756
                July 2003
                July 29 2003
                : 75
                : 3
                : 949-983
                Article
                10.1103/RevModPhys.75.949
                1f59eabf-b40f-4baf-90af-b2111d3cde77
                © 2003

                http://link.aps.org/licenses/aps-default-license

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