5
views
0
recommends
+1 Recommend
0 collections
    0
    shares
      • Record: found
      • Abstract: not found
      • Article: not found

      High‐resolution capacitance measurement and potentiometry by force microscopy

      , ,
      Applied Physics Letters
      AIP Publishing

      Read this article at

      ScienceOpenPublisher
      Bookmark
          There is no author summary for this article yet. Authors can add summaries to their articles on ScienceOpen to make them more accessible to a non-specialist audience.

          Abstract

          Related collections

          Most cited references7

          • Record: found
          • Abstract: not found
          • Article: not found

          Atomic Force Microscope

            Bookmark
            • Record: found
            • Abstract: not found
            • Article: not found

            Atomic force microscope–force mapping and profiling on a sub 100‐Å scale

              Bookmark
              • Record: found
              • Abstract: not found
              • Article: not found

              Magnetic imaging by ‘‘force microscopy’’ with 1000 Å resolution

                Bookmark

                Author and article information

                Journal
                Applied Physics Letters
                Appl. Phys. Lett.
                AIP Publishing
                0003-6951
                1077-3118
                March 28 1988
                March 28 1988
                : 52
                : 13
                : 1103-1105
                Article
                10.1063/1.99224
                212687b1-6968-4e1e-9e94-71f1dfb5d937
                © 1988
                Product
                Self URI (article page): http://aip.scitation.org/doi/10.1063/1.99224

                Comments

                Comment on this article