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      High‐resolution capacitance measurement and potentiometry by force microscopy

      Author(s): , ,
      Publication date Created:
      Publication date (Print):
      Journal: Applied Physics Letters
      Publisher: AIP Publishing

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          Atomic Force Microscope

          G. Binnig, C Quate, Andreas Gerber (1987)
          Article 0 comments Cited 2124 times – based on 0 reviews     Review now
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            Atomic force microscope–force mapping and profiling on a sub 100‐Å scale

            Y Martin, C Williams, H. Wickramasinghe (1987)
            Article 0 comments Cited 322 times – based on 0 reviews     Review now
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              Magnetic imaging by ‘‘force microscopy’’ with 1000 Å resolution

              Y Martin, H. Wickramasinghe (1987)
              Article 0 comments Cited 284 times – based on 0 reviews     Review now
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                Author and article information

                Journal
                Title: Applied Physics Letters
                Abbreviated Title: Appl. Phys. Lett.
                Publisher: AIP Publishing
                ISSN (Print): 0003-6951
                ISSN (Electronic): 1077-3118
                Publication date Created: March 28 1988
                Publication date (Print): March 28 1988
                Volume: 52
                Issue: 13
                Pages: 1103-1105
                Article
                DOI: 10.1063/1.99224
                SO-VID: 212687b1-6968-4e1e-9e94-71f1dfb5d937
                Copyright © © 1988
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