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      Adaptive reconstruction method for three-dimensional orientation imaging

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      Journal of Applied Crystallography
      International Union of Crystallography (IUCr)

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          Abstract

          An adaptive orientation reconstruction algorithm is developed for near-field high-energy X-ray diffraction microscopy. When combined with a spatially adaptive extension the algorithm results in a factor of 10–1000 speed-up over the existing forward modeling reconstruction method while preserving most of the spatial and orientation resolution characteristics. Tests of the reconstruction code based on simulated structures and real data on a complex microstructure are presented. Simulated structures include intra-granular orientation gradients and noisy detector images. It is shown that resolution in both real space and orientation space degrades gracefully as complexity and detector noise increase.

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            Greedy Randomized Adaptive Search Procedures

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              Three-dimensional X-ray structural microscopy with submicrometre resolution.

              Advanced materials and processing techniques are based largely on the generation and control of non-homogeneous microstructures, such as precipitates and grain boundaries. X-ray tomography can provide three-dimensional density and chemical distributions of such structures with submicrometre resolution; structural methods exist that give submicrometre resolution in two dimensions; and techniques are available for obtaining grain-centroid positions and grain-average strains in three dimensions. But non-destructive point-to-point three-dimensional structural probes have not hitherto been available for investigations at the critical mesoscopic length scales (tenths to hundreds of micrometres). As a result, investigations of three-dimensional mesoscale phenomena--such as grain growth, deformation, crumpling and strain-gradient effects--rely increasingly on computation and modelling without direct experimental input. Here we describe a three-dimensional X-ray microscopy technique that uses polychromatic synchrotron X-ray microbeams to probe local crystal structure, orientation and strain tensors with submicrometre spatial resolution. We demonstrate the utility of this approach with micrometre-resolution three-dimensional measurements of grain orientations and sizes in polycrystalline aluminium, and with micrometre depth-resolved measurements of elastic strain tensors in cylindrically bent silicon. This technique is applicable to single-crystal, polycrystalline, composite and functionally graded materials.
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                Author and article information

                Journal
                JACGAR
                Journal of Applied Crystallography
                J Appl Crystallogr
                J Appl Cryst
                International Union of Crystallography (IUCr)
                0021-8898
                April 2013
                March 14 2013
                April 01 2013
                : 46
                : 2
                : 512-524
                Article
                10.1107/S0021889813005268
                217aac13-36bd-4f9e-94b9-437616a71c59
                © 2013

                http://journals.iucr.org/services/copyrightpolicy.html

                http://journals.iucr.org/services/copyrightpolicy.html#TDM

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