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      IoT-TaaS: Towards a Prospective IoT Testing Framework

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          Journal
          Title: IEEE Access
          Abbreviated Title: IEEE Access
          Publisher: Institute of Electrical and Electronics Engineers (IEEE)
          ISSN (Electronic): 2169-3536
          Publication date Created: 2018
          Publication date (Print): 2018
          Volume: 6
          Pages: 15480-15493
          Article
          DOI: 10.1109/ACCESS.2018.2802489
          SO-VID: 218c4302-a118-4f25-915a-25d71df5ced7
          Copyright © © 2018
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