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      Conduction-band effective mass and bandgap of ZnSnN 2 earth-abundant solar absorber

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          Abstract

          Pseudo III-V nitride ZnSnN 2 is an earth-abundant semiconductor with a high optical absorption coefficient in the solar spectrum. Its bandgap can be tuned by controlling the cation sublattice disorder. Thus, it is a potential candidate for photovoltaic absorber materials. However, its important basic properties such as the intrinsic bandgap and effective mass have not yet been quantitatively determined. This paper presents a detailed optical absorption analysis of disordered ZnSnN 2 degenerately doped with oxygen (ZnSnN 2− x O x ) in the ultraviolet to infrared region to determine the conduction-band effective mass ( m c *) and intrinsic bandgap ( E g). ZnSnN 2− x O x epilayers are n-type degenerate semiconductors, which exhibit clear free-electron absorption in the infrared region. By analysing the free-electron absorption using the Drude model, m c * was determined to be (0.37 ± 0.05) m 0 ( m 0 denotes the free electron mass). The fundamental absorption edge in the visible to ultraviolet region shows a blue shift with increasing electron density. The analysis of the blue shift in the framework of the Burstein-Moss effect gives the E g value of 0.94 ± 0.02 eV. We believe that the findings of this study will provide important information to establish this material as a photovoltaic absorber.

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          Photovoltaic materials: Present efficiencies and future challenges.

          Recent developments in photovoltaic materials have led to continual improvements in their efficiency. We review the electrical characteristics of 16 widely studied geometries of photovoltaic materials with efficiencies of 10 to 29%. Comparison of these characteristics to the fundamental limits based on the Shockley-Queisser detailed-balance model provides a basis for identifying the key limiting factors, related to efficient light management and charge carrier collection, for these materials. Prospects for practical application and large-area fabrication are discussed for each material.
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            Band-gap narrowing in heavily doped many-valley semiconductors

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              Band-gap widening in heavily Sn-dopedIn2O3

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                Author and article information

                Contributors
                jscaoxiang@126.com
                n-yamada@isc.chubu.ac.jp
                Journal
                Sci Rep
                Sci Rep
                Scientific Reports
                Nature Publishing Group UK (London )
                2045-2322
                8 November 2017
                8 November 2017
                2017
                : 7
                : 14987
                Affiliations
                [1 ]ISNI 0000 0000 8868 2202, GRID grid.254217.7, Department of Applied Chemistry, Chubu University, ; Kasugai, 487-8501 Japan
                [2 ]ISNI 0000 0001 0789 6880, GRID grid.21941.3f, National Institute for Materials Science (NIMS), ; Tsukuba, 305-0044 Japan
                Author information
                http://orcid.org/0000-0003-0185-3577
                Article
                14850
                10.1038/s41598-017-14850-7
                5678229
                29118322
                222e4731-c21d-413a-b6a4-72aeba2919c2
                © The Author(s) 2017

                Open Access This article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/.

                History
                : 21 July 2017
                : 17 October 2017
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