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      Quantitative analysis of ferroelectric domain imaging with piezoresponse force microscopy

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          Abstract

          The contrast mechanism for ferroelectric domain imaging via piezoresponse force microscopy (PFM) is investigated. A novel analysis of PFM measurements is presented which takes into account the background caused by the experimental setup. This allows, for the first time, a quantitative, frequency independent analysis of the domain contrast which is in good agreement with the expected values for the piezoelectric deformation of the sample and satisfies the generally required features of PFM imaging.

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          Resonance modes of voltage-modulated scanning force microscopy

            Author and article information

            Journal
            2005-09-30
            Article
            10.1063/1.2362984
            cond-mat/0510005
            22eb45a8-6865-461a-919a-b810d7cbf01b
            History
            Custom metadata
            Appl. Phys. Lett. 89, 163507 (2006)
            cond-mat.mtrl-sci

            Condensed matter
            Condensed matter

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