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      Charge collection scanning electron microscopy

      Journal of Applied Physics
      AIP Publishing

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          Determination of Kilovolt Electron Energy Dissipation vs Penetration Distance in Solid Materials

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            Bandgap Dependence and Related Features of Radiation Ionization Energies in Semiconductors

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              Backscattering of Kilovolt Electrons from Solids

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                Author and article information

                Journal
                Journal of Applied Physics
                Journal of Applied Physics
                AIP Publishing
                0021-8979
                1089-7550
                June 1982
                June 1982
                : 53
                : 6
                : R51-R80
                Article
                10.1063/1.331667
                233dca51-2b70-4db2-9a6e-490864887def
                © 1982
                History

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