ScienceOpen:
research and publishing network
For Publishers
Discovery
Metadata
Peer review
Hosting
Publishing
For Researchers
Join
Publish
Review
Collect
My ScienceOpen
Sign in
Register
Dashboard
Blog
About
Search
Advanced search
My ScienceOpen
Sign in
Register
Dashboard
Search
Search
Advanced search
For Publishers
Discovery
Metadata
Peer review
Hosting
Publishing
For Researchers
Join
Publish
Review
Collect
Blog
About
33
views
158
references
Top references
cited by
153
Cite as...
0 reviews
Review
0
comments
Comment
0
recommends
+1
Recommend
0
collections
Add to
3
shares
Share
Twitter
Sina Weibo
Facebook
Email
775
similar
All similar
Record
: found
Abstract
: not found
Article
: not found
Charge collection scanning electron microscopy
Author(s):
H. J. Leamy
Publication date
Created:
June 1982
Publication date
(Print):
June 1982
Journal:
Journal of Applied Physics
Publisher:
AIP Publishing
Read this article at
ScienceOpen
Publisher
Review
Review article
Invite someone to review
Bookmark
Cite as...
There is no author summary for this article yet. Authors can add summaries to their articles on ScienceOpen to make them more accessible to a non-specialist audience.
Related collections
Atomic Force Microscopy
Most cited references
158
Record
: found
Abstract
: not found
Article
: not found
Determination of Kilovolt Electron Energy Dissipation vs Penetration Distance in Solid Materials
P. Hoff
,
T E Everhart
(1971)
0
comments
Cited
193
times
– based on
0
reviews
Review now
Bookmark
Record
: found
Abstract
: not found
Article
: not found
Bandgap Dependence and Related Features of Radiation Ionization Energies in Semiconductors
Claude Klein
(1968)
0
comments
Cited
159
times
– based on
0
reviews
Review now
Bookmark
Record
: found
Abstract
: not found
Article
: not found
Backscattering of Kilovolt Electrons from Solids
Ernest Sternglass
(1954)
0
comments
Cited
111
times
– based on
0
reviews
Review now
Bookmark
All references
Author and article information
Journal
Title:
Journal of Applied Physics
Abbreviated Title:
Journal of Applied Physics
Publisher:
AIP Publishing
ISSN (Print):
0021-8979
ISSN (Electronic):
1089-7550
Publication date Created:
June 1982
Publication date (Print):
June 1982
Volume
: 53
Issue
: 6
Pages
: R51-R80
Article
DOI:
10.1063/1.331667
SO-VID:
233dca51-2b70-4db2-9a6e-490864887def
Copyright ©
© 1982
History
Data availability:
Comments
Comment on this article
Sign in to comment
scite_
Similar content
775
Pericapillary Edema Assessment by Means of the Nailfold Capillaroscopy and Laser Scanning Microscopy
Authors:
Boris P Yakimov
,
Yury Gurfinkel
,
Denis Davydov
…
Study of the Electronic Structure of Individual Free-Standing Germanium Nanodots Using Spectroscopic Scanning Capacitance Microscopy
Authors:
Kin Mun Wong
Chemical and cryo-collection of muscle samples for transmission electron microscopy using Methacarn and dimethyl sulfoxide✰.
Authors:
Dylan Wilburn
,
Emma Fletcher
,
Ahmed Ismaeel
…
See all similar
Cited by
152
Secondary electron emission in the scanning electron microscope
Authors:
H E SEILER
Unpinned (100) GaAs surfaces in air using photochemistry
Authors:
A. Warren
,
S. Offsey
,
P. Kirchner
…
Cathodoluminescence scanning electron microscopy of semiconductors
Authors:
B. Yacobi
,
D. Holt
See all cited by
Most referenced authors
529
M Watanabe
T Kato
T. KATO
See all reference authors