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      Quasi-ideal strontium titanate crystal surfaces through formation of strontium hydroxide

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      Applied Physics Letters
      AIP Publishing

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          Atomic Control of the SrTiO3 Crystal Surface.

          The atomically smooth SrTiO(3) (100) with steps one unit cell in height was obtained by treating the crystal surface with a pH-controlled NH(4)F-HF solution. The homoepitaxy of SrTiO(3) film on the crystal surface proceeds in a perfect layer-by-layer mode as verified by reflection high-energy electron diffraction and atomic force microscopy. Ion scattering spectroscopy revealed that the TiO(2) atomic plane terminated the as-treated clean surface and that the terminating atomic layer could be tuned to the SrO atomic plane by homooepitaxial growth. This technology provides a well-defined substrate surface for atomically regulated epitaxial growth of such perovskite oxide films as YBa(2)Cu(3)O(7-delta).
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            Functional group imaging by chemical force microscopy.

            Mapping the spatial arrangement of chemical functional groups and their interactions is of significant importance to problems ranging from lubrication and adhesion to recognition in biological systems. A force microscope has been used to measure the adhesive and friction forces between molecularly modified probe tips and organic monolayers terminating in a lithographically defined pattern of distinct functional groups. The adhesive interactions between simple CH(3)/CH(3), CH(3)/COOH, and COOH/COOH functional groups correlate directly with friction images of sample surfaces patterned with these groups. Thus, by monitoring the friction between a specifically functionalized tip and sample, one can produce friction images that display predictable contrast and correspond to the spatial distribution of functional groups on the sample surface. Applications of this chemically sensitive imaging technique are discussed.
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              In situmonitoring during pulsed laser deposition of complex oxides using reflection high energy electron diffraction under high oxygen pressure

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                Author and article information

                Journal
                Applied Physics Letters
                Appl. Phys. Lett.
                AIP Publishing
                0003-6951
                1077-3118
                November 16 1998
                November 16 1998
                : 73
                : 20
                : 2920-2922
                Article
                10.1063/1.122630
                2530bf7a-03ba-4599-a6cf-50b5f98e121b
                © 1998
                History

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