- Record: found
- Abstract: not found
- Article: not found
Percolation models for gate oxide breakdown
Read this article at
ScienceOpenPublisher
There is no author summary for this article yet. Authors can add summaries to their articles on ScienceOpen to make them more accessible to a non-specialist audience.
Related collections
Most cited references26
- Record: found
- Abstract: not found
- Article: not found
Fractal Dimension of Dielectric Breakdown
L. Niemeyer, L Pietronero, H. J. Wiesmann (1984)
- Record: found
- Abstract: not found
- Article: not found
Impact ionization, trap creation, degradation, and breakdown in silicon dioxide films on silicon
E. Cartier, D. Arnold, D. DiMaria (1993)
- Record: found
- Abstract: not found
- Article: not found
Dielectric breakdown in electrically stressed thin films of thermal SiO2
Eli Harari (1978)