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      In situ spectroscopic ellipsometry growth studies on the Al-doped ZnO films deposited by remote plasma-enhanced metalorganic chemical vapor deposition

      Author(s): , ,
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      Journal: Journal of Applied Physics
      Publisher: AIP Publishing

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          Electrical-Resistivity Model for Polycrystalline Films: the Case of Arbitrary Reflection at External Surfaces

          A. F. Mayadas, M. Shatzkes (1970)
          Article 0 comments Cited 353 times – based on 0 reviews     Review now
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            Transparent conducting oxide semiconductors for transparent electrodes

            Tadatsugu Minami (2005)
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              Spectroscopic Ellipsometry

              Hiroyuki Fujiwara (2007)
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                Author and article information

                Journal
                Title: Journal of Applied Physics
                Abbreviated Title: Journal of Applied Physics
                Publisher: AIP Publishing
                ISSN (Print): 0021-8979
                ISSN (Electronic): 1089-7550
                Publication date Created: February 2008
                Publication date (Print): February 2008
                Volume: 103
                Issue: 3
                Page: 033704
                Article
                DOI: 10.1063/1.2837109
                SO-VID: 286f591b-4b7c-4e30-b250-56f3481cd634
                Copyright © © 2008
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