Author(s): M. Flickner , H. Sawhney , W. Niblack , J. Ashley , Qian Huang , B. Dom , M. Gorkani , J. Hafner , D. Lee , D. Petkovic , D. Steele , P. Yanker
Publication date (Print): Sept. 1995
Journal: Computer
Publisher: Institute of Electrical and Electronics Engineers (IEEE)