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Electron backscatter diffraction and electron channeling contrast imaging of tilt and dislocations in nitride thin films

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      The application of electron backscatter diffraction and orientation contrast imaging in the SEM to textural problems in rocks

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        Microstructure of GaN laterally overgrown by metalorganic chemical vapor deposition

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          Electron channeling patterns in the scanning electron microscope

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            Author and article information

            Journal
            PRBMDO
            Physical Review B
            Phys. Rev. B
            American Physical Society (APS)
            1098-0121
            1550-235X
            February 2007
            February 1 2007
            : 75
            : 8
            10.1103/PhysRevB.75.085301
            © 2007

            http://link.aps.org/licenses/aps-default-license

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