An easily computed functional level testability measure

Thearling, K.; Abraham, J.

doi:10.1109/TEST.1989.82322

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An easily computed functional level testability measure

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Author(s): K. Thearling , J. Abraham

Publication date: 1989

Publisher: IEEE Comput. Soc. Press

Conference name: Proceedings. 'Meeting the Tests of Time'., International Test Conference

Conference date: 29-31 Aug. 1989

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Publisher: IEEE Comput. Soc. Press

Publication date: 1989

Pages: 381-390

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DOI: 10.1109/TEST.1989.82322

SO-VID: 2a536427-89bf-4230-8b53-3acf98ce7afe

Conference name: Proceedings. 'Meeting the Tests of Time'., International Test Conference

Conference location: Washington, DC, USA

Conference date: 29-31 Aug. 1989

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An easily computed functional level testability measure

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