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      Characterization of encapsulated quantum dots via electron channeling contrast imaging

      1 , 2 , 3 , 1 , 1 , 2
      Applied Physics Letters
      AIP Publishing

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          Transmission Electron Microscopy

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            Mode-locked quantum-dot lasers

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              Electron channeling patterns in the scanning electron microscope

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                Author and article information

                Journal
                Applied Physics Letters
                Appl. Phys. Lett.
                AIP Publishing
                0003-6951
                1077-3118
                August 08 2016
                August 08 2016
                : 109
                : 6
                : 062101
                Affiliations
                [1 ]Department of Materials Science and Engineering, The Ohio State University, Columbus, Ohio 43210, USA
                [2 ]Department of Electrical and Computer Engineering, The Ohio State University, Columbus, Ohio 43210, USA
                [3 ]Department of Materials Science and Engineering, Carnegie Mellon University, Pittsburgh, Pennsylvania 15213, USA
                Article
                10.1063/1.4960643
                2b24e584-bd69-444b-a486-548d1f2196bd
                © 2016

                https://publishing.aip.org/authors/rights-and-permissions

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