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      Room Temperature Tunable Multiferroic Properties in Sol-Gel-Derived Nanocrystalline Sr(Ti 1− x Fe x )O 3−δ Thin Films

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          Abstract

          Sr(Ti 1− x Fe x )O 3−δ (0 ≤ x ≤ 0.2) thin films were grown on Si(100) substrates with LaNiO 3 buffer-layer by a sol-gel process. Influence of Fe substitution concentration on the structural, ferroelectric, and magnetic properties, as well as the leakage current behaviors of the Sr(Ti 1− x Fe x )O 3−δ thin films, were investigated by using the X-ray diffractometer (XRD), atomic force microscopy (AFM), the ferroelectric test system, and the vibrating sample magnetometer (VSM). After substituting a small amount of Ti ion with Fe, highly enhanced ferroelectric properties were obtained successfully in SrTi 0.9Ti 0.1O 3−δ thin films, with a double remanent polarization (2 P r ) of 1.56, 1.95, and 9.14 μC·cm −2, respectively, for the samples were annealed in air, oxygen, and nitrogen atmospheres. The leakage current densities of the Fe-doped SrTiO 3 thin films are about 10 −6–10 −5 A·cm −2 at an applied electric field of 100 kV·cm −1, and the conduction mechanism of the thin film capacitors with various Fe concentrations has been analyzed. The ferromagnetic properties of the Sr(Ti 1− x Fe x )O 3−δ thin films have been investigated, which can be correlated to the mixed valence ions and the effects of the grain boundary. The present results revealed the multiferroic nature of the Sr(Ti 1− x Fe x )O 3−δ thin films. The effect of the annealing environment on the room temperature magnetic and ferroelectric properties of Sr(Ti 0.9Fe 0.1)O 3−δ thin films were also discussed in detail.

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          SrTiO3: An intrinsic quantum paraelectric below 4 K

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            Ferroelectric Memories

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              Soft Phonon Modes and the 110°K Phase Transition in SrTiO3

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                Author and article information

                Journal
                Nanomaterials (Basel)
                Nanomaterials (Basel)
                nanomaterials
                Nanomaterials
                MDPI
                2079-4991
                08 September 2017
                September 2017
                : 7
                : 9
                : 264
                Affiliations
                [1 ]School of Physics & Optoelectric Engineering, Guangdong University of Technology, Guangzhou Higher Education Mega Centre, Guangzhou 510006, China; wangyiguang2011@ 123456gmail.com (Y.-G.W.); liuqx@ 123456gdut.edu.cn (Q.-X.L.); ypjiang@ 123456gdut.edu.cn (Y.-P.J.)
                [2 ]Laboratory Teaching Center, Guangdong University of Technology, Guangzhou Higher Education Mega Center, Guangzhou 510006, China; jianglili@ 123456gdut.edu.cn
                Author notes
                [* ]Correspondence: xgtang@ 123456gdut.edu.cn ; Tel./Fax: +86-20-3932-2265
                Author information
                https://orcid.org/0000-0001-6429-2098
                Article
                nanomaterials-07-00264
                10.3390/nano7090264
                5618375
                28885579
                2c4eea9b-ca70-44ad-abdd-2e9a2d45432a
                © 2017 by the authors.

                Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license ( http://creativecommons.org/licenses/by/4.0/).

                History
                : 17 August 2017
                : 05 September 2017
                Categories
                Article

                srti1−xfexo3 thin films,sol-gel,multiferroic,leakage current,conduction mechanism

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