Experimental study of bias dependence of pulsed laser-induced single-event transient in SiGe HBT

Wang, Yudong; Sun, Yabin; Zhou, Wei; Fu, Jun; Shi, Yanling; Li, Xiaojin; Liu, Zhihong

doi:10.1016/j.microrel.2016.08.008

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Experimental study of bias dependence of pulsed laser-induced single-event transient in SiGe HBT

Author(s): Yabin Sun , Jun Fu , Yudong Wang , Wei Zhou , Zhihong Liu , Xiaojin Li , Yanling Shi

Publication date Created: October 2016

Publication date (Print): October 2016

Journal: Microelectronics Reliability

Publisher: Elsevier BV

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Title: Microelectronics Reliability

Abbreviated Title: Microelectronics Reliability

Publisher: Elsevier BV

ISSN (Print): 00262714

Publication date Created: October 2016

Publication date (Print): October 2016

Volume: 65

Pages: 41-46

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DOI: 10.1016/j.microrel.2016.08.008

SO-VID: 2e27a788-c78c-48d2-94c2-3ea742a02fe6

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Experimental study of bias dependence of pulsed laser-induced single-event transient in SiGe HBT

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