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      Crosshatched surface morphology in strained III‐V semiconductor films

      Author(s): , , , ,
      Publication date Created:
      Publication date (Print):
      Journal: Journal of Applied Physics
      Publisher: AIP Publishing

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          Defects in epitaxial multilayers

          J.W. Matthews, A.E. Blakeslee (1974)
          Article 0 comments Cited 664 times – based on 0 reviews     Review now
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            Defects in epitaxial multilayers

            A.E. Blakeslee, J.W. Matthews (1975)
            Article 0 comments Cited 132 times – based on 0 reviews     Review now
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              Use of misfit strain to remove dislocations from epitaxial thin films

              J.W. Matthews, S. Mader, A.E. Blakeslee (1976)
              Article 0 comments Cited 92 times – based on 0 reviews     Review now
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                Author and article information

                Journal
                Title: Journal of Applied Physics
                Abbreviated Title: Journal of Applied Physics
                Publisher: AIP Publishing
                ISSN (Print): 0021-8979
                ISSN (Electronic): 1089-7550
                Publication date Created: May 1990
                Publication date (Print): May 1990
                Volume: 67
                Issue: 9
                Pages: 4093-4098
                Article
                DOI: 10.1063/1.344968
                SO-VID: 30a52121-7c4e-47b7-b705-c7403657a5bf
                Copyright © © 1990
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