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TASSER A temperature-aware statistical soft-error-rate analysis framework for combinational circuits
Author(s):
Sung S.-Y. Hsueh
,
Ryan H.-M. Huang
,
Charles H.-P. Wen
Publication date:
2014
Journal:
Fifteenth International Symposium on Quality Electronic Design
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Core Readings in Statistical Mediation Analysis
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DOI::
10.1109/ISQED.2014.6783372
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