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      Spectroscopic ellipsometry data analysis: measured versus calculated quantities

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      Journal: Thin Solid Films
      Publisher: Elsevier BV

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          Optics in Stratified and Anisotropic Media: 4×4-Matrix Formulation

          Dwight Berreman (1972)
          Article 0 comments Cited 272 times – based on 0 reviews     Review now
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            Optical dispersion relations for amorphous semiconductors and amorphous dielectrics

            A. Forouhi, I. Bloomer (1986)
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              Polarization-dependent optical parameters of arbitrarily anisotropic homogeneous layered systems

              Mathias Schubert (1996)
              Article 0 comments Cited 90 times – based on 0 reviews     Review now
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                Author and article information

                Journal
                Title: Thin Solid Films
                Abbreviated Title: Thin Solid Films
                Publisher: Elsevier BV
                ISSN (Print): 00406090
                Publication date Created: February 1998
                Publication date (Print): February 1998
                Volume: 313-314
                Issue:
                Pages: 33-39
                Article
                DOI: 10.1016/S0040-6090(97)00765-7
                SO-VID: 320acac3-091b-4ca0-9a98-d58067324f0a
                Copyright © © 1998
                License:

                http://www.elsevier.com/tdm/userlicense/1.0/

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