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      Direct analysis of thin-layer chromatography spots by diffuse reflectance Fourier transform infrared spectrometry

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          Journal
          Analytical Chemistry
          Anal. Chem.
          American Chemical Society (ACS)
          0003-2700
          1520-6882
          May 2002
          December 1984
          May 2002
          December 1984
          : 56
          : 14
          : 2935-2939
          10.1021/ac00278a071
          © 1984
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