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Structural and magnetic properties of Co2MnSi thin films

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      Abstract

      Co2MnSi (CMS) films of different thicknesses (20, 50 and 100 nm) were grown by radio frequency (RF) sputtering on a-plane sapphire substrates. Our X-rays diffraction study shows that, in all the samples, the cubic <110> CSM axis is normal to the substrate and that there exist well defined preferential in-plane orientations. Static and dynamic magnetic properties were investigated using vibrating sample magnetometry (VSM) and micro-strip line ferromagnetic resonance (MS-FMR), respectively. From the resonance measurements versus the direction and the amplitude of an applied magnetic field we derive most of the magnetic parameters: magnetization, gyromagnetic factor, exchange stiffness coefficient and magnetic anisotropy terms. The in-plane anisotropy can be described as resulting from the superposition of two terms showing a two-fold and a four-fold symmetry without necessarily identical principal axes. The observed behavior of the hysteresis loops is in agreement with this complex form of the in-plane anisotropy

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      Journal
      17 December 2010
      2011-02-17
      1012.3837 10.1002/pssa.201228039

      http://arxiv.org/licenses/nonexclusive-distrib/1.0/

      Custom metadata
      physica status solidi (a), 209, 1328 (2012)
      7 pages, 5 figures, submitted to Journal of Physics: Condensed Matter
      cond-mat.mtrl-sci

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